NS2s-SI-3.5-1.8-PRO

產品型號：NS2s-SI-3.5-1.8-PRO
產品說明：

The NS2s-Si/3.5/1.8-PRO scanning-slit profiling system (P/N PH00464) with 3.5 mm aperture accurately captures and analyzes wavelengths from 190 to 1100 nm with its Silicon detector. It features a 1.8 µm slit size suitable for small beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive laser analysis. NanoScan Pro software is included.

NS2s-SI-3.5-1.8-PRO Datasheet

價格(NTD)：$0

產品規格 Software

Model	NS2s-Si/3.5/1.8
Sensor Type	Silicon
Spectral Range	190 - 1100nm
Slit Size	1.8 µm
Aperture Size	3.5 mm
Beam Size	7 µm - 2.3 mm
Scanhead Size	83 mm
Power Range	10 nW - 10 W
Communication	USB 2.0
Software	NanoScan Professional
Compatible Light Sources	CW, Pulsed >25kHz
CE Compliance	Yes
UKCA Compliance	Yes
China RoHS Compliance	Yes

Software – NanoScan 2s Professional Version

NanoScan 2s Configurable User Interface

In addition to new hardware, the NanoScan 2s has an updated integrated software package for the Microsoft Windows Platform, which allows the user to display any of the results windows on one screen. The NanoScan 2s software comes in two versions, STD and PRO. The NanoScan 2s Pro version includes ActiveX automation for users who want to integrate the NanoScan into OEM systems or create their own user interface screens with C++, LabView, Excel or other OEM software packages.

See Your Beam As Never Before

Integrated Power Meter

The silicon and germanium detector equipped NanoScan 2s systems include an integrated 200mW power meter. The scanhead comes with a quartz attenuator window that provides a uniform response across a broad wavelength range. This is a relative power meter that has better than 1.5% correspondence when calibrated with a user-supplied power meter and used in the same configuration as calibrated. The power meter screen in the software shows both the total power and the individual power in each of the beams being measured.

Available Detectors

The NanoScan 2s is available with silicon, germanium or pyroelectric detectors to cover the light spectrum from UV to very far infrared.

Apertures and Slits

The NanoScan 2s is available with a variety of apertures and slit sizes to allow for the accurate measurement of varying beam sizes. The slit width defines the minimum beam width that can be measured; due to convolution error, the slit should be no larger than ¼ the beam diameter to provide a ±3% accurate measurement. For this reason the minimum beam diameter measureable with the standard 5μm slit is 20μm. To measure beams smaller than 20μm it is necessary to use the small aperture 1.8μm slit instrument, providing a minimum beam diameter of ~8μm. Because these slits are so narrow, the maximum length limits the aperture to 3.5mm. Contrary to many people’s beliefs, these smaller slits do not improve the resolution of the measurement, only the minimum size of the beam. Therefore, unless it is necessary to measure beams less than 20μm, one would be advised to stick with the 9mm/5μm configurations. For very large beams, NanoScan is available with a large 20 or 25mm aperture with 25μm slits. These sensor are larger than the standard scan heads (100mm diameter)

The Most Versatile and Flexible Beam Profiling System Available

With the available range of detectors, slit sizes and apertures the NanoScan 2s provides the maximum versatility in laser beam profiling. NanoScan 2s adds the convenience and portability of direct USB connectivity: no external controllers or power supplies required to operate the profiler. In addition the rotation mount has been redesigned to provide a stand for vertical operation, if desired. The mount can be positioned in one of two places. If vertical operation is desired the mount is positioned toward the back of the scanhead to expose the stand, which can be affixed to the optical table or stage. If standard horizontal operation is desired, then the rotation mount can be positioned in the forward configuration, maintaining the original length and size of the scanhead.

For Higher Powers, Teams up the NanoScan with the LBS-300s

In order to measure powers and energies above the limits of the NanoScan, an LBS-300s of the appropriate wavelength rang can be attached to the front of the NanoScan and measure powers up to 1000W and more. The C mount thread of the LBS-300s mates with the C mount thread of the NanoScan. There are various models of the LBS-300s ranging in wavelength from 190nm up to 1550nm and beyond. Alternatively, the Stackable Beam
Splitters can be attached to the NanoScan and used to attenuate high power beams.

Measured Beam Results

From 1989 through 1996, John Fleischer, founder and past President of Photon Inc., chaired the working laser beam width ISO/DIN committee that resulted in the ISO/DIN 11146 standard. The final approved standard, available in 13 languages. The standard governs profile measurements and analysis using scanning apertures, variable apertures, area sensors and detector arrays. NanoScan 2s measures spatial beam irradiance profiles using scanning slit techniques.

Results measured include:
• Bֺֺeam Width at standard and user-definable clip levels, including 1/e² and 4σ
• Cֺֺentroid Position
• Pֺֺeak Position
• Eֺֺllipticity
• Gֺֺaussian Fit
• Bֺֺeam Divergence
• Bֺֺeam Separation
• Pֺֺointing Stability
• RֺֺOI Power
• Tֺֺotal Power
• Pֺֺulsed Laser Repetition Rate

M² Wizard

M-squared (M²) software Wizard is an interactive program for determining the “times diffraction limit” factor M² by the Rayleigh Method. The M² Wizard prompts and guides the user through a series of manual measurements and data entries required for calculating M². Used with a user-provided translation stage focusing lens and the M² Wizard in the NanoScan Analysis Software, the user can quickly and easily determine the times-diffraction propagation factor (M²) of a laser. For automated and automatic M² measurements the NanoModeScan option is required.

Pulsed Laser Beam Profiling

In addition to profiling CW laser beams, NanoScan can also profile pulsed laser beams with repetition rate in the 10kHz range and above. To enable the measurement of these pulsed lasers, the NanoScan profiler incorporates a “peak connect” algorithm and softwarecontrolled variable scan speed on all scanheads. The accuracy of the measurement generally depends on the laser beam spot size and the pulse-to-pulse repeatability of the laser. The NanoScan is ideal for measuring Q-switched lasers and lasers operating with pulse width modulation power (PWM) control. In the past few years, lasers with pico- and femtosecond pulse durations have begun to be used in many applications. Although these lasers add some additional complication to the measurement techniques, the NanoScan can also measure this class of laser.

Professional Version Automation Interface
For customer who want to incorporate the NanoScan 2s into an automated procedure or to create a customized user interface, the PRO version scanheads include an ActiveX Automation Server that can be used by an Automation Client written in Visual Basic for Applications (VBA), C/C++ or by an application which supports ActiveX Automation, such as Microsoft Excel, Microsoft Word or National Instruments’ LabVIEW. The software package include example of programs written in Excel and LabVIEW in the automation folder.

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