NS2s-SI-9-25-STD

Model:NS2s-SI-9-25-STD
Description:
    This NanoScan scanning-slit profiling system accurately captures and analyzes wavelengths from 190nm - 950nm with its Silicon detector. It features a slit size suitable for low-power beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of UV, Visible, and NIR lasers.
    • Beam Sizes of 100µm to ~6mm
    • Power Levels of ~10nW to ~10W
    • USB 2.0 Interface
    • NanoScan Standard software included
Price(USD):$0

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