190 to 1100nm Silicon Detector Scanning Slit

 190 to 1100nm Silicon Detector Scanning Slit

Product name : 190 to 1100nm Silicon Detector Scanning Slit
Description :
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.

Specification


NanoScan 2s Scanhead Model Si/3.5/1.8µm Si/9/5µm Si/9/25µm
Wavelength 190nm – 950nm 190nm – 950nm 190nm – 950nm
Slit Size 1.8µm 5µm 25µm
Aperture Size 3.5mm 9mm 9mm
1/e2 Beam Diameter Range 7µm – ~2.3mm 20µm – ~6mm 100µm – ~6mm
Spatial Sampling Resolution 5.3nm – 18.3µm
Profile Digitization 16-bit
Scan frequency 1.25, 2.5, 5, 10, 20Hz
Power Reading User calibrated
Power Aperture Window Metalized Quartz (200mW upper limit)
Laser Type CW or Pulsed
Rotation Mount Standard
Scanhead Dimension 63.4mm diameter x76.8mm long
Model Description Price(USD) Quantity
0 NS2s-SI-3.5-1.8-STD Small Beam Scanning Slit Profiler: Silicon Detector, 3.5mm Aperture, 1.8µm Slits, Standard Software -
1 NS2s-SI-9-5-STD Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 5µm Slits, Standard Software -
2 NS2s-SI-9-25-STD Low Power Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 25µm Slits, Standard Software -
3 NS2s-SI-3.5-1.8-PRO Small Beam Scanning Slit Profiler:Silicon Detector,3.5mm Aperture,1.8µm Slits,Professional Software -
4 NS2s-SI-9-5-PRO Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 5µm Slits, Professional Software -
5 NS2s-SI-9-25-PRO Low Power Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 25µm Slits, Professional Software -