High Power Beam Profiling

 High Power Beam Profiling

Product name : High Power Beam Profiling
Description :
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers.

Specification
 
Model Description Price(USD) Quantity
0 BW-NIR-130 BeamWatch Non-Contact Beam Profiler, 130 µm Min Spot Size, 950-1100 nm, GigE -
1 BW-PLUS-45 BeamWatch Plus , Non-Contact Beam Profiler, 45 µm Min Spot Size, 420-635nm and 950-1100 nm, GigE -
2 BW-Integrated-150-NIR-155-ProfiNet BeamWatch Integrated Non-Contact Beam Profiler System, 150-175 mm, 980-1080 nm, ProfiNet -
3 BW-Integrated-150-NIR-155-EtherNet/IP BeamWatch Integrated Non-Contact Beam Profiler System, 150-175 mm, 980-1080 nm, EtherNet/IP -
4 BW-Integrated-150-NIR-155-CC-Link BeamWatch Integrated Non-Contact Beam Profiler System, 150-175 mm, 980-1080 nm, CC-Link -
5 BW-Integrated-500-NIR-155-ProfiNet BeamWatch Integrated Non-Contact Beam Profiler System, 500 mm, 980-1080 nm, ProfiNet -
6 BW-Integrated-500-NIR-155-EtherNet/IP BeamWatch Integrated Non-Contact Beam Profiler System, 500 mm, 980-1080 nm, EtherNet/IP -
7 BW-Integrated-500-NIR-155-CC-Link BeamWatch Integrated Non-Contact Beam Profiler System, 500 mm, 980-1080 nm, CC-Link -
8 BW-NIR-2-50-AM BeamWatch AM Non-Contact Beam Profiler, 50 µm Min Spot Size, 1060-1080 nm -
9 BeamPeek Beam Profiler, Focal Spot Analysis and Power Measurement ,AM Chambers -
10 BeamCheck Beam profiling System for Additive Manufacturing, Wavelength 1060 to 1080nm -