Hard X-Ray and Extreme UV Wavefront Sensors
Hard X-Ray and Extreme UV Wavefront Sensors
Product name : Hard X-Ray and Extreme UV Wavefront Sensors
Description :
HASO HXR Wavefront Sensor
The HASO HXR provides live measurement of the optical quality of your beamline at strategic positions such as after the monochromator, after an optics or a sample. Fluctuations of the position of a focal point can also be characterized.
HASO EUV Wavefront Sensor
The HASO EUV offers unsurpassed quality, precision and ease of use for ultra-short wavelength beam characterization, adjustment and alignment.
Specification
| PRODUCT NAME | PUPIL SIZE W x L (mm2) | PHASE POINT RESOLUTION | MICROLENS NUMBER / (LIFT PH. P. RES.) | MAX FREQ. (Hz) | WAVELENGTH (nm) | REPEATABILITY (RMS λ/n) | ABSOLUTE ACCURACY (RMS λ/n) |
| HASO HXR | 3 x 3 | 22500 | 150 x 150 | 10 | 0.05 - 0.25 (5-25 keV) | 30 | 10 |
| HASO EUV | 13 x 13 | 5184 | 72 x 72 | 1 | 4 - 40 (30 - 300 eV) | 200 | 50 |
| HASO HXR | HASO EUV |
 |
 |
| BEST FOR – Source characterization – Real-time alignment of optical systems, e.g., KB, toroidal, etc. – Phase imaging of biological material, nanoparticles, archeological artifacts – Precise driving of X-Ray active optics |
BEST FOR – HHG, synchrotron and EUV-FEL beam alignment and characterization – Mirror alignment in beamlines, Bender optimization – Stability characterization – Schwarzschild telescope alignment and characterization – Zoneplace characterization – Plasma science |